Single-Device On-Site Inspection System for Non-Destructive Internal Defect Detection in Trees Near Constructed Facilities
| Autorzy | Zhang Y.; Skibniewski M.; Chow C.; Lau D. |
|---|---|
| Tytuł | Single-Device On-Site Inspection System for Non-Destructive Internal Defect Detection in Trees Near Constructed Facilities |
| Czasopismo | Results in Engineering |
| Rok | 2026 |
| Status | Published |
| Tom | 32 |
| DOI | 10.1016/j.rineng.2026.111732 |
| URL | https://doi.org/10.1016/j.rineng.2026.111732 |